Showing results: 46 - 60 of 98 items found.
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BERT 1001/1005 Series -
Quantifi Photonics Inc.
The BERT is 2 or 4-channel PPG and Error Detector for the design, characterization and production of optical transceivers and opto-electrical components at data rates up to 30 Gb/s.With scalability and exceptional signal fidelity, it is a cost effective test solution for 400 Gb/s communication eco-systems.
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EV-SFP-171 -
UC Instruments, Corp.
The purpose of this SFP+ evaluation board is to provide the designer with a convenient means for evaluating SFP+ fiber optic transceiver such as 10 Gb/s(up to 16 Gb/s) SFP/SFP+ transceiver compliant with ANSI Fibre Channel FC‐PI‐5 for high speed electrical and optical specifications. This board provides SMA connectors for high speed TX and RX signals. The low speed control signals such as Tx_Fault, Rx_LOS and Rate_Selects can be controlled by using on board switches and test points. A connector for 2 wire serial interface to the module is also provided.
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OSA 1000 Series -
Quantifi Photonics Inc.
The OSA 1000 Series provides grating-based spectral test and measurement. It is an excellent fit for the testing of optical sources, amplifiers, transceivers and passive optical components.The OSA is available in a range of wavelengths for different applications, so you pay only for the capabilities you need.
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Quantifi Photonics Inc.
The OSA 1000 Series provides grating-based spectral test and measurement. It is an excellent fit for the testing of optical sources, amplifiers, transceivers and passive optical components.The OSA is available in a range of wavelengths for different applications, so you pay only for the capabilities you need.
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AQ6360 -
Yokogawa Test & Measurement Corp.
The AQ6360 is the fastest optical spectrum analyzer for optical device manufacturing offered by Yokogawa. It is a cost-effective optical spectrum analyzer ideal for industrial manufacturing of telecom devices such as lasers, optical transceivers and optical amplifiers. The AQ6360 features a wavelength range of 1200 to 1650 nm for ideal manufacturing test performance.
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ATS-3100 VRS -
Astronics Corporation
The ATS-3100 VRS, the newest member of the ATS-3100 PXI Integration Platform product family and fifth-generation radio test solution, is a single, consolidated platform for testing legacy, modern, and next-gen, software-defined radios for military, civil, and commercial users. Integrating the PXI Vector Signal Transceiver (VST) from National Instruments (NI), the platform enables faster test time with wider bandwidth (up to 1GHz) than any other radio test solution available today.
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TFMC900 -
TEWS Technologies GmbH
The TFMC900 is an FMC (FPGA Mezzanine Card) Mezzanine Module designed to test ANSI/VITA 57.1 FMC Carriers during development or series production. Additionally, it offers the possibility to realise various I/O solutions for connected FMC Carriers. Interconnection of the High Pin Count FMC Connector signals can be verified by JTAG and by functional tests. A loop-back of the 10 multi-gigabit transceiver interfaces allows interconnection checks for the high-speed serial interfaces.
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JFW Industries
Family of RF test systems designed for transceiver testing. Designed for radio-to-radio testing in a closed mesh network. Step attenuators allow you to dynamically fade up/down the RF signal between radios. These Ethernet/Serial models run our latest generation 3.x.x firmware that features easy to use ASCII formatted remote commands.
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Eye-BERT MicroX -
Spectronix
The Eye-BERT MicroX is a compact, easy to use test solution offering high performance bit error rate testing at a fraction of the cost of competing solutions. The unit is offered in two speed grades including the X10 which operates up to 14.5Gbps, and the X30 which extends the data rate to 29Gbps. Its broad data rate capabilities and long test patterns make this unit suitable for testing nearly all optical SFP, SFP+, and SFP28 transceivers in production with just one unit. The real-time eye opening monitor and eye scanning capability can aid in troubleshooting by providing the operator with additional link quality information. Other features include Autonomous pattern detection, SFP diagnostic tools, and wavelength tuning (per transceiver capability). With a click of a button the Eye-BERT MicroX will automatically test an SFP module based on its advertised capabilities and generate a detailed test report complete with manufacturer, part number, serial number, date code, fiber type, link length, speed, and test results. The Unit is supplied with anti-skid bumpers and is small enough to be integrated into larger systems for dedicated link verification.
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EV-QSFP-174 -
UC Instruments, Corp.
The EV‐QSFP‐174 QSFP/QSFP+ Host Test Board comes complete with Windows based software (Windows XP & above) to enable intuitive memory map programming and testing, controlled via a mini B USB port. It is designed to simulate an ideal environment for QSFP/QSFP+ transceiver module testing, characterization and manufacturing test. Its high speed properties make the host board as electrically transparent as possible, allowing for a more accurate assessment of the module’s performance.
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786939-01 -
NI
PXIe, 28 Gbps, 8-Channel PXI High-Speed Serial Instrument. - The PXIe-6594 is designed for engineers who need to validate, interface through, and test serial protocols. It includes a Xilinx Kintex Ultrascale+ FPGA to implement various high-speed serial protocols, and it is … programmable in LabVIEW FPGA for maximum application-specific customization and reuse. The PXIe-6594 takes advantage of FPGA multigigabit transceivers for up to eight TX and RX lanes.
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multiLane
In an everchanging industry, new form factors are launched to support higher speeds like 800G and later, 1.6T. With the speed per lane increasing exponentially, the need for thermal and cooling tests also rises with new requirements and demands.MultiLane is offering a OSFP-XD thermal load with a controller board, with the goal of emulating transceiver thermal behavior, but also to test cooling systems.
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783639-01 -
NI
10 Gbps, 4-Channel PXI High-Speed Serial Instrument—The PXIe‑6592 is designed for engineers who need to validate, interface through, and test serial protocols. It includes a Xilinx Kintex‑7 FPGA to implement various high-speed serial protocols, and it is programmable in LabVIEW FPGA for maximum application-specific customization and reuse. The PXIe‑6592 takes advantage of FPGA multigigabit transceivers and up to four TX and RX lanes.
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785976-01 -
NI
PXIe, 16 Gbps, 8-Channel PXI High-Speed Serial Instrument - The PXIe‑6593 is designed for engineers who need to validate, interface through, and test serial protocols. It includes a Xilinx Kintex Ultrascale FPGA to implement various high-speed serial protocols, and it is … programmable in LabVIEW FPGA for maximum application-specific customization and reuse. The PXIe‑6593 takes advantage of FPGA multigigabit transceivers for up to eight TX and RX lanes.
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785977-01 -
NI
PXIe, 16 Gbps, 8-Channel PXI High-Speed Serial Instrument - The PXIe‑6593 is designed for engineers who need to validate, interface through, and test serial protocols. It includes a Xilinx Kintex Ultrascale FPGA to implement various high-speed serial protocols, and it is … programmable in LabVIEW FPGA for maximum application-specific customization and reuse. The PXIe‑6593 takes advantage of FPGA multigigabit transceivers for up to eight TX and RX lanes.
